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By: John Boxall

Hello
Each cycle in my demonstration was a read/write to each address. The final count was the number of my cycles until one of the addresses was at fault. Therefore this exceeded the data sheet specification. However you need to take into consideration temperature as well, the test was conducted in a room around 22 degrees C. If you are planning something I would still stick with Atmel’s spec in the data sheet. Or in other words, always plan for the worst. Image may be NSFW.
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:)

cheers
john


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